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Scanning-probe Single-electron Capacitance Spectroscopy
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JoVE Journal Engineering
Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

DOI:
10.3791/50676-v

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10:53 min

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July 30, 2013

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, , , , ,
1Department of Physics and Astronomy,Michigan State University, 2Department of Chemistry & Biochemistry/Physics,Mercyhurst University, 3Department of Physics,Saint Louis University, 4Department of Physics,Massachusetts Institute of Technology

Chapters

  • 00:05Title
  • 01:57Microscope Setup, Preparation, and Mounting of the High Electron Mobility Transistor Circuit
  • 06:37Capacitance Mode Measurements
  • 08:05Results: Scanning Charge Accumulation and Capacitance-voltage Spectroscopy of Doped Semiconductors
  • 10:17Conclusion

Summary

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Scanning-probe single-electron capacitance spectroscopy facilitates the study of single-electron motion in localized subsurface regions. A sensitive charge-detection circuit is incorporated into a cryogenic scanning probe microscope to investigate small systems of dopant atoms beneath the surface of semiconductor samples.

Tags

Scanning-probeSingle-electronCapacitance SpectroscopyElectronic Quantum StructureSubsurface Charge Accumulation (SCA) ImagingSpatial ResolutionCharge ResolutionHEMTCryogenic Temperatures

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