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Omfattende Karakterisering av Extended Defekter i halvledermaterialer av en scanning elektronmikroskop
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Chapters
- 00:05Title
- 01:16Sample Preparation for Cryo-cathodoluminescence Experiment
- 02:06Cryo-cathodoluminescence Experiment
- 06:28Performing Cross-correlation Electron Backscatter Diffraction Experiments
- 08:50Results: Cathodoluminenscence and Strain Fields of Extended Defects in Silicon
- 10:19Conclusion
The optical, electrical, and structural properties of dislocations and of grain boundaries in semiconductor materials can be determined by experiments performed in a scanning electron microscope. Electron microscopy has been used to investigate cathodoluminescence, electron beam induced current, and diffraction of backscattered electrons.
