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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
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Engineering
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JoVE Journal Engineering
Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

DOI:
10.3791/54924-v

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10:25 min

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December 20, 2016

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, , , , ,
1Physics Department,Durham University

Chapters

  • 00:05Title
  • 00:59Equipment and Substrate Preparation
  • 02:39Cantilever and Tip Preparation
  • 03:22Set-up of AFM Cell and Cantilever Calibration
  • 04:27Approach and Initial Check of the Sample
  • 06:31High-resolution Imaging
  • 08:09Results: Sub-nanometer Resolution Imaging of Soft and Stiff Samples
  • 09:18Conclusion

Summary

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We present a method for achieving sub-nanometer resolution images with amplitude-modulation (tapping mode) atomic force microscopy in liquid. The method is demonstrated on commercial atomic force microscopes. We explain the rationale behind our choices of parameters and suggest strategies for resolution optimization.

Tags

Keywords: Sub-nanometer ResolutionAmplitude-modulation Atomic Force MicroscopyLiquidHigh Resolution ImagingCommercial AFMTapping ModeSample PreparationCleaningMica SubstrateEpoxy GlueAdhesive Tape

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