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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies
 

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Article DOI: 10.3791/64102-v • 12:18 min • June 27th, 2022
June 27th, 2022 •
*1, *1, 2, 1,3, 1,3, 1,3
1Micron School of Materials Science & Engineering, Boise State University, 2Material, Physical, and Chemical Sciences Center, Sandia National Laboratories, 3Center for Advanced Energy Studies
* These authors contributed equally

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Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

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Keywords: Kelvin Probe Force Microscopy (KPFM) Scanning Electron Microscopy (SEM) Colocalization Corrosion Characterization Alloys Surface Potential Surface Topography Material Structure Property Performance Sample Preparation Conductive Path AFM Probe
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