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量子干涉效应在硅谐振环光子源测量
JoVE Journal
Engineering
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JoVE Journal
Engineering
Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
Please note that all translations are automatically generated.
Click here for the English version.
量子干涉效应在硅谐振环光子源测量
DOI:
10.3791/55257-v
•
12:19 min
•
April 04, 2017
•
Jeffrey A. Steidle
,
Michael L. Fanto
2
,
Stefan F. Preble
,
Christopher C. Tison
3,4
,
Gregory A. Howland
,
Zihao Wang
,
Paul M. Alsing
1
Microsystems Engineering
,
Rochester Institute of Technology
,
2
Air Force Research Laboratory, Rome, NY
,
3
Department of Physics
,
Florida Atlantic University
,
4
Quanterion Solutions Incorporated
Chapters
00:05
Title
00:34
Photonic Chip Preparation
02:24
Preparation of Fiber Pigtails
03:45
Configuration of the Photonic Chip and Fibers
06:09
Dispersion Characterization
08:42
Measuring Two-photon Interference
10:25
Results: Interference and Bi-photon Visibility Measurement
11:32
Conclusion
Summary
Automatic Translation
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Automatic Translation
硅光子芯片必须认识到复杂的集成量子系统的潜力。这里介绍的是用于制备和测试对于量子测量硅光子芯片的方法。
Tags
Quantum Interference
Silicon Ring Resonator
Photon Source
Integrated Photonics
Chip-scale Photon Pair Source
Quantum Integrated Photonic Circuits
Photonic Chip
Pump Circuit
Ring Resonator
Mach-Zehnder Interferometer
On-chip Heating
Phase Shift
Chip Polishing
Fiber Preparation
Fiber Stripper
Fiber Cleaver
Fusion Splicer
Sleeve Oven
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