Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Engineering / Karakterisering av SiN-integrerade optiska…
JoVE Journal
Engineering

This content is Open Access.

JoVE Journal Engineering
Karakterisering av SiN-integrerade optiska fasader på en teststation i waferskala
3D Printing of Biomolecular Models for Research and Pedagogy
Journal (Engineering)
3D Printing of Biomolecular Models for Research and Pedagogy
A Virtual Simulation Experiment of Mechanics: Material Deformation and Failure Based on Scanning Electron Microscopy
Journal (Engineering)
A Virtual Simulation Experiment of Mechanics: Material Deformation and Failure Based on Scanning Electron Microscopy
 
Click here for the English version

Karakterisering av SiN-integrerade optiska fasader på en teststation i waferskala

Article DOI: 10.3791/60269-v • 05:57 min • April 1st, 2020
April 1st, 2020 •
1, 1, 1, 1, 1, 1, 1
1University Grenoble Alpes and CEA, LETI, Minatec Campus

Chapters

Summary
Automatic Translation

Please note that all translations are automatically generated.

Click here for the English version.

Här beskriver vi driften av en SiN integrerad fotonisk krets som innehåller optiska fasader. Kretsarna används för att avge låga divergens laserstrålar i nära infraröd och styra dem i två dimensioner.

Tags

Engineering Optiskfasad arrayer integrerad fotonik SiN kiselfotonik strålstyrning LIDAR tvådimensioner enkel våglängd
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter