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In Situ Transmission Electron Mikroskopi med biasing og fabrikasjon av asymmetriske tverrligger basert på blandet faset a-VOx
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In Situ Transmission Electron Mikroskopi med biasing og fabrikasjon av asymmetriske tverrligger basert på blandet faset a-VOx

Article DOI: 10.3791/61026-v • 09:49 min • May 13th, 2020
May 13th, 2020 •
*1, *2, 1
1Functional Materials and Microsystems Research Group and the Micro Nano Research Facility, RMIT University, 2RMIT Microscopy and Microanalysis Facility, RMIT University
* These authors contributed equally

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Presentert her er en protokoll for å analysere nanostrukturelle endringer under in situ biasing med overføring elektron mikroskopi (TEM) for en stablet metall-isolator-metall struktur. Den har betydelige anvendelser i resistiv bytte tverrligger for neste generasjon av programmerbare logikk kretser og neuromimicking maskinvare, for å avsløre sine underliggende driftsmekanismer og praktisk anvendelighet.

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Engineering resistiv veksling in situ overføring elektron mikroskopi tverrligger nanostrukturell analyse flyktige terskelveksling amorf vanadiumoksid
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