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Characterization of Surface Modifications by White Light Interferometry
 

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Article DOI: 10.3791/50260-v 11:47 min February 27th, 2013
February 27th, 2013

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résumé

White light microscope interferometry is an optical, noncontact and quick method for measuring the topography of surfaces. It is shown how the method can be applied toward mechanical wear analysis, where wear scars on tribological test samples are analyzed; and in materials science to determine ion beam sputtering or laser ablation volumes and depths.

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Keywords: White Light Interferometry Optical Profilometry Surface Topography Ion Sputtering Laser Ablation Tribology Surface Roughness Wear Depth Profiling Materials Characterization
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