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Writing and Low-Temperature Characterization of Oxide Nanostructures
 

Writing and Low-Temperature Characterization of Oxide Nanostructures

Article DOI: 10.3791/51886-v • 06:44 min • July 18th, 2014
July 18th, 2014 •
1, 1, 1, 1, 1, 1, 1, 1
1Department of Physics, University of Pittsburgh

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Oxide nanostructures provide new opportunities for science and technology. The interfacial conductivity between LaAlO3 and SrTiO3 can be controlled with near-atomic precision using a conductive atomic force microscopy technique. The protocol for creating and measuring conductive nanostructures at LaAlO3/SrTiO3 interfaces is demonstrated.

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Keywords: Oxide Nanoelectronics LaAlO3/SrTiO3 Nanostructures Conductive Atomic Force Microscopy Nanolithography Transport Measurements Low-temperature Characterization
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