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Implementation of a Reference Interferometer for Nanodetection
 

Implementation of a Reference Interferometer for Nanodetection

Article DOI: 10.3791/51133-v • 16:12 min • April 26th, 2014
April 26th, 2014 •
*1, *1, 1
1Department of Electrical and Computer Engineering, University of Victoria
* These authors contributed equally

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A reference interferometer technique, which is designed to remove undesirable laser jitter noise for nanodetection, is utilized for probing an ultra-high quality factor microcavity. Instructions for assembly, setup, and data acquisition are provided, alongside the measurement process for specifying the cavity quality factor.

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Keywords: Reference Interferometer Nanodetection Fiber Interferometer Microcavity Free Spectral Range Fiber Taper Laser Jitter Noise Polystyrene Nanobeads Adaptive Curve Fitting Quality Factor Resonant Wavelength Split Frequency Shifts Binding Events
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