Journal
/
/
Gericht Ion Beam Frezen en Scanning Electron Microscopy van hersenweefsel
JoVE Journal
Neuroscience
This content is Free Access.
JoVE Journal Neuroscience
Focussed Ion Beam Milling and Scanning Electron Microscopy of Brain Tissue
DOI:

08:57 min

July 06, 2011

, ,

Chapters

  • 00:05Title
  • 01:29Sample Fixation and Resin Embedding
  • 04:00Preparing the Sample for the FIB/SEM
  • 05:55Imaging the FIB/SEM
  • 08:03Results: FIB/SEM Images of Brain Tissue
  • 08:40Conclusion

Summary

Automatic Translation

Dit protocol beschrijft hoe hars ingebed hersenweefsel kan worden voorbereid en afgebeeld in de drie dimensies in de gerichte ion beam, scanning electronen microscoop.

Related Videos

Read Article