Waiting
Login processing...

Trial ends in Request Full Access Tell Your Colleague About Jove
Journal / Engineering / Bruk av X-ray Imaging Crystal spektroskopi for…
JoVE Journal
Engineering

A subscription to JoVE is required to view this content. Sign in or start your free trial.

JoVE Journal Engineering
Bruk av X-ray Imaging Crystal spektroskopi for bruk som en High Temperature Plasma Diagnostic
Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
Journal (Engineering)
Evanescent Field Based Photoacoustics: Optical Property Evaluation at Surfaces
Method for Recording Broadband High Resolution Emission Spectra of Laboratory Lightning Arcs
Journal (Engineering)
Method for Recording Broadband High Resolution Emission Spectra of Laboratory Lightning Arcs
 
Click here for the English version

Bruk av X-ray Imaging Crystal spektroskopi for bruk som en High Temperature Plasma Diagnostic

Article DOI: 10.3791/54408-v • 06:46 min • August 25th, 2016
August 25th, 2016 •
1, 2, 3
1Department of Nuclear Science and Engineering, Massachusetts Institute of Technology, 2Department of Physics, Massachusetts Institute of Technology, 3Plasma Science and Fusion Center, Massachusetts Institute of Technology

Chapters

Summary
Automatic Translation

Please note that all translations are automatically generated.

Click here for the English version.

X-ray spektra gir et vell av informasjon om høy temperatur plasmaer. Dette manuskriptet viser driften av en høy bølgelengde oppløsning romlig avbildning av røntgen spektrometer brukes til å vise hydrogen og helium-lignende ioner av mellomatomnummer elementer i en tokamak plasma.

Tags

Engineering røntgenspektroskopi Crystal spektroskopi plasmafysikk Fusion Tokamaks Plasma Diagnostics
Read Article

Get cutting-edge science videos from JoVE sent straight to your inbox every month.

Waiting X
Simple Hit Counter