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Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis
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Biologie
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Journal JoVE Biologie
Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

Contact Mode Atomic Force Microscopy as a Rapid Technique for Morphological Observation and Bacterial Cell Damage Analysis

DOI:
10.3791/64823-v

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05:34 min

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June 30, 2023

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, , , ,
1Centro Universitario de los Lagos,Universidad de Guadalajara, 2Centro Nacional de Recursos Genéticos,Instituto Nacional de Investigaciones Forestales, Agrícolas y Pecuarias

Chapitres

  • 00:04Introduction
  • 00:31Bacterial Sample Preparation and AFM Measurements
  • 03:10Results: Atomic Force Contact Microscopic Analysis of Bacterial Cultures Under Nanoparticle Influence
  • 04:46Conclusion

Summary

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Traduction automatique

Here, we present the application of atomic force microscopy (AFM) as a simple and fast method for bacterial characterization and analyze details such as the bacterial size and shape, bacterial culture biofilms, and the activity of nanoparticles as bactericides.

Tags

Contact Mode Atomic Force MicroscopyMorphological ObservationBacterial Cell Damage AnalysisFixed SampleContact ModeContAI-G ProbesAuto SlopeZ ControllerScan RangeXY PlaneLine By Line LevelingStaphylococcus AureusCocci AggregatesPopulation DistributionCocci Morphology

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