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Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies
 

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Article DOI: 10.3791/64102-v • 12:18 min • June 27th, 2022
June 27th, 2022 •
*1, *1, 2, 1,3, 1,3, 1,3
1Micron School of Materials Science & Engineering, Boise State University, 2Material, Physical, and Chemical Sciences Center, Sandia National Laboratories, 3Center for Advanced Energy Studies
* These authors contributed equally

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Kelvin probe force microscopy (KPFM) measures surface topography and differences in surface potential, while scanning electron microscopy (SEM) and associated spectroscopies can elucidate surface morphology, composition, crystallinity, and crystallographic orientation. Accordingly, the co-localization of SEM with KPFM can provide insight into the effects of nanoscale composition and surface structure on corrosion.

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Kelvin Probe Force Microscopy KPFM Surface Topography Surface Potential Scanning Electron Microscopy SEM Composition Crystalinity Crystallographic Orientation Material Structure Property Performance Relationships Corrosion Initiation Corrosion Propagation Mechanisms Probe Calibration Fiducials Marking Glove Box Humidity Control Dimensional Requirements Optical Microscopy Colocalization Method
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