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Measurement of Tension Release During Laser Induced Axon Lesion to Evaluate Axonal Adhesion to the Substrate at Piconewton and Millisecond Resolution
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Bioengineering
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JoVE Journal Bioengineering
Measurement of Tension Release During Laser Induced Axon Lesion to Evaluate Axonal Adhesion to the Substrate at Piconewton and Millisecond Resolution

Measurement of Tension Release During Laser Induced Axon Lesion to Evaluate Axonal Adhesion to the Substrate at Piconewton and Millisecond Resolution

DOI:
10.3791/50477-v

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09:31 min

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May 27, 2013

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, ,
1Institute of Biophysics,National Research Council of Italy, 2Dipartimento di Sistemi e Informatica,Università di Firenze, 3Department of Neuroscience and Brain Technologies,Istituto Italiano di Tecnologia

Chapters

  • 00:05Title
  • 01:27Laser Microsphere Manipulation
  • 03:31UV and IR Beam Positioning and Optical Tweezer Calibration
  • 04:56Axotomy and Simultaneous Force Measurement
  • 06:50Results: Measurement of Changes in Cytoskeletal Equilibrium Caused by Laser Induced Lesions
  • 08:50Conclusion

Summary

Automatic Translation

Automatic Translation

We measured the tension release in an axon that was partially lesioned with a laser dissector by simultaneous force spectroscopy measurement performed on an optically-trapped probe adhered to the membrane of the axon. The developed experimental protocol evaluates the axon adhesion to the culture substrate.

Tags

Laser-induced Axon LesionTension ReleaseAxonal AdhesionForce SpectroscopyInterferometric TrackingOptical TrappingCell-substrate CouplingNeurite GrowthNeuronal Regeneration

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